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Round up timing data. Minor display adjustments. Group cycle and access times, display the CAS value for each (SDRAM). Refactor some bitfield tests into loops (SDRAM). Display latencies and burst length on a single line (SDRAM). Don't display manufacturing location when undefined. Check that the manufacturing date is proper BCD, else fall back to hexadecimal display. git-svn-id: http://lm-sensors.org/svn/lm-sensors/trunk@3303 7894878c-1315-0410-8ee3-d5d059ff63e0